- Jooyong Kim (Electromagnetic
modeling of interconnects)
- Byungki Woo (proximity/crack sensors, rf/id and EAS tags)
- Byunghwa Park (mems, chemical
sensors )
- Yoon Sok Park (mems, chemical sensors)
- Karthik Subramanian (mems, chemical sensors)
- Jun Wan Kim (mems, bolometers)
date last updated: 08/27/01
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