Research in the Microelectromagnetic Device Group


For further information contact Professor Dean Neikirk at

neikirk@mail.utexas.edu


Interconnect and transmission line modeling summary.

Interconnect Series Impedance Determination Using a Surface Ribbon Method
Emre Tuncer, Beom-Taek Lee, Sangwoo Kim, and Dean P. Neikirk
Department of Electrical and Computer Engineering
University of Texas at Austin
Austin, Texas 78712


Most of the slides shown here were presented at the IEEE 3rd Topical Meeting on Electrical Performance of Electronic Packaging (EPEP), Monterey, CA, Nov. 2-4, 1994; the work is summarized in the paper above, and also in our EPEP 94 Proceedings paper:

- E. Tuncer, Beom-Taek Lee, and D. P. Neikirk, "Interconnect Series Impedance Determination Using a Surface Ribbon Method" IEEE 3rd Topical Meeting on Electrical Performance of Electronic Packaging, Monterey, CA, Nov. 2-4, 1994, pp. 250-252.

The accuracy of the ribbon technique using a minimum numbers of ribbons is discussed in our presentation at EPEP 96:

- B.-T. Lee and D. P. Neikirk, "Minimum Segmentation in the Surface Ribbon Method for Series Impedance Calculations of Microstrip Lines," IEEE 5th Topical Meeting on Electrical Performance of Electronic Packaging, Napa, CA, October 28-30, 1996.

The accuracy for "twin lead" using minimum ribbons shown below was calculated by Sangwoo Kim in our group.




















Efficiency can be improved even further by minimizing the number of ribbons used.